Optical Implementation of a Second-Order Neural Network Discriminator Model (<Special Section>OPTICAL COMPUTING 1)

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概要

• 論文の詳細を見る

• Some of the symmetries inherent in a second-order translation invariant classifier model are described. The operational characteristics of this model for pattern recognition tasks such as fault and noise tolerance are explored. A particular optical architecture is detailed which exploits particular features of the model suited to optics and the operation of this system described.

• 社団法人応用物理学会の論文
• 1990-07-20

著者

• Arimoto Akira

  Central Research Laboratory Hitachi Ltd.

• Horan P.

  Central Research Laboratories Hitachi Ltd.:hitachi Dublin Laboratory

• UECKER D.

  Central Research Laboratories, Hitachi Ltd.

• Uecker D.

  Central Research Laboratories Hitachi Ltd.:univ. Of California

• Arimoto Akira

  Central Research Laboratories Hitachi Ltd.

関連論文

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• XY-Stage-Based Electron-Beam Recorder for the Single-Carrier Independent Pit-Edge Recording Radial Partial Response Format
• Optical Implementation of a Second-Order Neural Network Discriminator Model (OPTICAL COMPUTING 1)

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