Measuring the Oxygen Diffusion in C-Axis Oriented ErBa_2Cu_3O_x Films Using In Situ X-ray Diffraction Technique
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概要
- 論文の詳細を見る
An in situ X-ray technique was used to study the diffusion of oxygen in c-axis oriented ErBa_2Cu_3O_x films made by rf magnetron sputtering. The diffusion is mainly parallel to the c-axis of the film, and the coefficients for oxygen diffusion are estimated to be in the order of 10^<-14> and 10^<-12>cm^2・s^<-1> at annealing temperatures of 50O℃ and 900℃, respectively.
- 社団法人応用物理学会の論文
- 1990-05-20
著者
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Matsui Masakazu
Yokohama R & D Laboratories The Furukawa Electric Co. Ltd.
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Matsui Masakazu
Yokohama R&d Laboratories The Furukawa Electrical Co. Ltd.
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Narumi Eiki
New York State Institute on Superconductivity, State University of New York at Buffalo
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Shaw David
New York State Institute on Superconductivity, State University of New York at Buffalo
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Shaw D
State Univ. New York At Buffalo New York Usa
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Shaw David
New York State Institute On Superconductivity State University Of New York At Buffalo
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Narumi E
State Univ. New York At Buffalo New York Usa
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Narumi Eiki
New York State Institute On Superconductivity State University Of New York At Buffalo
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YAMAMOTO Kiyoshi
Yokohama R&D Laboratories, The Furukawa Electrical Co., Ltd.
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Yamamoto Kiyoshi
Yokohama R&d Laboratories The Furukawa Electrical Co. Ltd.
関連論文
- C-Axis Oriented YBa_2Cu_O_ Films on Amorphous Silicate Glasses Using Laser Deposition
- Static SIMS Studies of Superconducting YBa_2Cu_3O_ Thin Films
- Measuring the Oxygen Diffusion in C-Axis Oriented ErBa_2Cu_3O_x Films Using In Situ X-ray Diffraction Technique