Temperature Dependence of the Half-Wave Voltage in Ti:LiNbO_3 Waveguide Devices at 0.83 μm

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概要

• 論文の詳細を見る

• We report on experimental results of the temperature dependence of the refractive index change induced by an electric field in Ti-diffused LiNbO_3 waveguide phase modulators for a wavelength of 0.83 μm in the temperature range from 0℃ to 105℃.

• 社団法人応用物理学会の論文
• 1990-12-20

著者

• Fujiwara T

  Electronics Materials Laboratory Sumitomo Metal Mining Co. Ltd.

• Fujiwara Takumi

  Electronics Materials Laboratory Sumitomo Metal Mining Co. Ltd.

• Mori Hiroshi

  Electronics Materials Laboratory, Sumitomo Metal Mining, Co., Ltd

• KAWAZOE Takemi

  Electronics Materials Laboratory, Sumitomo Metal Mining Co., Ltd.

• Kawazoe Takemi

  Electronics Materials Laboratory Sumitomo Metal Mining Co. Ltd.

• Mori Hiroshi

  Electronics Materials Laboratory Sumitomo Metal Mining Co Ltd.

関連論文

• Observation of Striations in Nd: YAG with Circularly Polarized Light
• Ion Beam Analysis of ZnSe
• Temperature Dependence of the Half-Wave Voltage in Ti:LiNbO_3 Waveguide Devices at 0.83 μm

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