Magnetoresistance Properties of Cu/Co/Cu/NiFe Multilayers with a Few Stacking Numbers

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概要

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• [Cu/Co/Cu/NiFe]_N multilayers were prepared using electron-beam evaporation in an ultrahigh vacuum and their magnetoresistive (MR) properties with a few stacking numbers (N) were studied. The N dependence of the MR property was affected by the magnetic layer thickness. In the range of N≦2, a thick magnetic layer was required to obtain a large MR ratio. In the multilayer of Cr(50 Å)/NiFe(50 Å)/Cu(50 Å)/Co(50 Å)/Cu(50 Å)/NiFe(50 Å) (N=1.5), the MR ratio of 5.6% and the MR slope of 0.5%/Oe were obtained.

• 社団法人応用物理学会の論文
• 1995-01-01

著者

• Araki Satoru

  R&D Center, TDK Corporation

• Miyauchi D

  R&d Center Tdk Corporation

• MIYAUCHI Daisuke

  R&D Center, TDK Corporation

関連論文

• Coexistence of Granular-Like Component and Interlayer Coupling in Co/Ag Multilayers
• Giant Magnetoresistance and Oscillatory Magnetic Coupling of Evaporated and MBE-Grown Co/Ag Multilayers
• Magnetoresistance Properties of Cu/Co/Cu/NiFe Multilayers with a Few Stacking Numbers

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