Characterization of Superconducting Tunnel Junction X-ray Detectors by Low Temperature Scanning Electron Microscopy
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1998-08-10
著者
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Huebener Rudolf
Physikalisches Institut Lehrstuhl Experimentalphysik Ii Universitat Tubingen
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Ohkubo Masataka
Electrotechnical Laboratory
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Sakamoto Isao
Electrotechnical Laboratory
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HAYASHI Nobuyuki
Electrotechnical Laboratory
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MARTIN Jens
Physikalisches Institut, Lehrstuhl Experimentalphysik II, Universitat Tubingen
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PANTELEIT Friedhelm
Physikalisches Institut, Lehrstuhl Experimentalphysik II, Universitat Tubingen
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Martin Jens
Physikalisches Institut Lehrstuhl Experimentalphysik Ii Universitat Tubingen
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Panteleit Friedhelm
Physikalisches Institut Lehrstuhl Experimentalphysik Ii Universitat Tubingen
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