X-Ray Diffraction Characterization of Cadmium Stearate Langmuir-Blodgett Films

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概要

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• The X-ray 00∫Bragg peak intensities were analyzed for multilayer Cd stearate films deposited by the Langmuir Blodgett method on glass, aluminum and SiO_2 substrates. Most of the samples were found to be a mixture of regular and disordered layer structures. One sample on a SiO_2 substrate was found to have a regular layer structure like a single crystal containing no disorder.

• 社団法人応用物理学会の論文
• 1987-05-20

著者

• Mizushima Koichi

  Electronic Devices Laboratory Toshiba Research And Development Center

• Azuma Makoto

  Electronic Devices Laboratory Toshiba Research And Development Center

• Nakayama Toshio

  Electronic Devices Laboratory Toshiba Research And Development Center

関連論文

• X-Ray Diffraction Characterization of Cadmium Stearate Langmuir-Blodgett Films

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