A Simple Method to Measure Deviations from the Stoichiometric Composition in GaAs Crystals with a 4-Circle X-ray Diffractometer

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1986-02-20

著者

• Okano Takeshi

  Mitsubishi Monsanto Chemical Industries Ltd.

• Matsuzaki Takao

  Mitsubishi Kasei Corporation Research Center:school Of Pharmaceutical Sciences Kitasato University

• TOMOTAKE Yasuko

  Mitsubishi Chemical Industries Lid.

• YAJIMA Fumikazu

  Mitsubishi Chemical Industries Lid.

関連論文

• A Simple Method to Measure Deviations from the Stoichiometric Composition in GaAs Crystals with a 4-Circle X-ray Diffractometer
• PC workstations in crystallography

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