Planar Defect in A15 Structure Observed in Cr-Si Fine Particles

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概要

• 論文の詳細を見る

• A new planar defect in the A 15 structure was found in fine particles formed by the evaporation of Cr-Si alloy in Xe gas. Electron microscopic analysis showed that the planar defect lies on the {100} plane and the displacement vector due to the defect is <±1/8, 1/2, 0>a. A probable model of the defect is proposed.

• 社団法人応用物理学会の論文
• 1983-07-20

著者

• Fukano Yasushige

  College Of General Education Nagoya University

• Ishimasa Tsutomu

  College Of General Education Nagoya University

関連論文

• Crystal Structure and Morphology of Fine Particles of Vanadium Silicides
• Planar Defect in A15 Structure Observed in Cr-Si Fine Particles

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