X-Ray Diffraction Characterization of Cadmium Stearate Langmuir-Blodgett Films II : Surfaces, Interfaces and Films

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概要

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• Non-Bragg reflection, which is observed prominently at low angles for Cd stearate Langmuir-Blodgett films, has been analyzed by a method which is a simple extension of the ordinary kinematical diffraction theory, and the applicability of the ordinary theory to the Bragg reflection from very thin LB films was also examined. Evidence for the crystallization of the films with time and the correlation between the reflection intensity and kind of substrate are also reported. Finally, an anomalous enhancement of the reflection intensity observed for particular films deposited on glass or on SiO_2 formed thermally on Si is discussed.

• 社団法人応用物理学会の論文
• 1988-05-20

著者

• Mizushima Koichi

  Erectronic Devices Laboratory Toshiba Research And Development Center

• Azuma Makoto

  Erectronic Devices Laboratory Toshiba Research And Development Center

• EGUSA Shun

  Erectronic Devices Laboratory, Toshiba Research and Development Center

• Egusa Shun

  Erectronic Devices Laboratory Toshiba Research And Development Center

関連論文

• X-Ray Diffraction Characterization of Cadmium Stearate Langmuir-Blodgett Films II : Surfaces, Interfaces and Films

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