Characteristic of DC SQUIDs Patterned on Highly Granular Y-Ba-Cu-O Thin Films : Electrical Properties of Condensed Matter
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1988-12-20
著者
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Tsai J‐s
Nec Fundamental Research Laboratories
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Tsai Jaw-shen
Microelectronics Research Laboratories Nec Corporation
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Ichiro TAKEUCHI
Microelectronics Research Laboratories, NEC Corporation
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Hisanao TSUGE
Microelectronics Research Laboratories, NEC Corporation
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Noritsugu MATSUOKA
Microelectronics Research Laboratories, NEC Corporation
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Tsuge H
Nec Functional Materials Res. Lab. Kanagawa Jpn
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Hisanao Tsuge
Microelectronics Research Laboratories Nec Corporation
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Noritsugu Matsuoka
Microelectronics Research Laboratories Nec Corporation
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Ichiro Takeuchi
Microelectronics Research Laboratories Nec Corporation
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- Characteristic of DC SQUIDs Patterned on Highly Granular Y-Ba-Cu-O Thin Films : Electrical Properties of Condensed Matter
- Atomic Structure of Si (111)-(√×√) R30°-Al Studied by First Principle Molecular Dynamics
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