In Situ X-Ray Topographic Study of Sweeping of Impurity Ions in Quartz Crystals

概要

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X-ray topographic studies were made on alpha quartz crystals with in situ electric field using graphite and silver electrodes at elevated temperatures in vacuum. A strong dark striation contrast appeared out the topographs near the anode side of the crystals when recorded with electric field along the c-axis. The effect is attributed to lattice deformation by space charge collection caused by the removal of the charge compensating impurity ions. The striation contrast disappeared as the temperature was raised above the stability range of the alpha phase. A strong contrast also appeared on the topographs near the cathode side of the crystals when silver electrodes were used. This contrast was due to the accumulation of the silver electrode material. The contrast at the anode end due to sweeping was predominant when the dc electric field was along the c-axis whereas the contrast near the cathode end was present irrespective of the direction of the electric field inside the crystals. Spotty contrast due to the evolution of fluid inclusion with increasing temperature has also been observed in some crystals.
社団法人応用物理学会の論文
1999-07-15