Low-Temperature Deposition of SrTiO_3 Thin Films by Electron-Cyclotron-Resonance Sputtering for Monolithic Microwave Integrated Circuits Operatirng in the mm-Wave Band
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1998-04-15
著者
-
Ikuta Kenji
Ntt System Electronics Laboratories
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TSUKADA Mitsuo
NTT System Electronics Laboratories
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NISHIMURA Hiroshi
NTT System Electronics Laboratories
関連論文
- Upper-bound Frequency for Measuring mm-Wave-Band Dielectric Characteristics of Thin Films on Semiconductor Substrates
- Low-Temperature Deposition of SrTiO_3 Thin Films by Electron-Cyclotron-Resonance Sputtering for Monolithic Microwave Integrated Circuits Operatirng in the mm-Wave Band
- Low-Temperature Deposition of SrTiO3 Thin Films by Electron-Cyclotron-Resonance Sputtering for Monolithic Microwave Integrated Circuits Operating in the mm-Wave Band