PdGeSbTe Alloy for Phase Change Optical Recording
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概要
- 論文の詳細を見る
Phase change optical recording disks using a Pd-Ge-Sb-Te quaternary alloy demonstrated high crystallization speed and long-term thermal stability of the amorphous recording marks. This alloy film can be crystallized by a short duration laser pulse of less than 100 ns. It is applicable to a single beam overwrite optical recording system. The crystallized portion of this recording layer on the disk is assigned to single phase and polycrystalline face-centered-cubic (fcc) crystals by transmission electron diffraction. A small amount of Pd atoms (typically 0.2 to 3 at.%) in this alloy improve the thermal stability of amorphous marks.
- 社団法人応用物理学会の論文
- 1998-04-15
著者
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Hirota Kusato
Electronic And Imaging Materials Research Laboratories Toray Industries Inc.
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OHBAYASHI Gentaro
Electronic and Imaging Materials Research Laboratories, Toray Industries, Inc.
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Ohbayashi Gentaro
Electronic And Imaging Materials Research Laboratories Toray Industries Inc.
関連論文
- Design of a Near-Field Probe for Optical Recording Using a 3-Dimensional Finite Difference Time Domain Method
- Near-Field Phase Change Optical Recording Using a GaP Hemispherical Lens
- PdGeSbTe Alloy for Phase Change Optical Recording