Spatial Resolutions and Polarization Analysis in Raman Microprobe Technique
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概要
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The spatial resolutions and polarization analysis in the Raman microprobe technique were dealt with. The spatial resolutions for the axial and the horizontal directions of high-numerical-aperture objectives in vacuum were estimated theoretically by the analysis of the spatial distribution of the incident electric field near the focal point. Based on the results, a method of correction for the polarization scrambling effect caused by the sharp focusing objective in the polarization analysis, which is a modification of the method derived by Turrell, was derived. This was applied successfully to the analysis of spectral change due to the shift of the focus in a specimen such as α-quartz.
- 社団法人応用物理学会の論文
- 1996-06-15
著者
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ISHIOKA Tsutomu
Department of Chemistry, Faculty of Science, Toyama University
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Ishioka T
Toyama Univ. Toyama
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Ishioka Tsutomu
Department Of Chemistry Faculty Of Science Toyama University
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