Temperature Decrease Caused by Voltage Generation in Metal-Insulator-Metal Structure of Polyimide Langmuir-Blodgett Insulating Film: Possibility of a New Phenomenon of Energy Conversion

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概要

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• Voltage was generated in metal-insulator-metal (MIM) structures of Al/polyimide Langmuir-Blodgett insulating film/Au which were fabricted in 1986. Temperature decrease caused by the voltage generation was ascertained by noncontact temperature measurements using a vacuum avalanche photodiode. The voltage is still being generated today. Electron diffusion via the Langmuir-Blodgett (LB) film was observed and was considered to be the cause of the voltage generation. From the experimental results, it was found that the present MIM is a new microscopic element that transduces heat energy to electrical energy.

• 社団法人応用物理学会の論文
• 1996-04-15

著者

• Hino Taro

  Electrical Engineering Kanagawa University

関連論文

• Power Source of Metal-Ultrathin Dielectric Film-Metal Structures
• Temperature Decrease Caused by Voltage Generation in Metal-Insulator-Metal Structure of Polyimide Langmuir-Blodgett Insulating Film: Possibility of a New Phenomenon of Energy Conversion

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