Analysis of Smear Noise in Interline-CCD Image Sensor with Gate-Free Isolation Structure

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1991-12-30

著者

• Ozaki Toshifumi

  Central Research Laboratory Hitachi Ltd.

• ONO Hideyuki

  Central Research Laboratory, Hitachi, Ltd.

• TANAKA Haruhiko

  Central Research Laboratory, Hitachi, Ltd.

• KAWAMOTO Yoshifumi

  Central Research Laboratory, Hitachi, Ltd.

• Ono Hideyuki

  Central Research Laboratory Hitachi Ltd.

• Tanaka Haruhiko

  Central Research Laboratory Hitachi Ltd.

• Kawamoto Yoshifumi

  Central Research Laboratory Hitachi Ltd.

関連論文

• Analysis of Smear Noise in Interline-CCD Image Sensor with Gate-Free Isolation Structure
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