Monitoring Sintering / Densification and Crystallization / Grain-Growth in Tl-Based High Temperature Superconductors by Electrical Conductivity Measurements
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概要
- 論文の詳細を見る
An "in situ" electrical resistance method has been used to monitor sintering to best achieve a high percentage of Tl-2223 structure. By this means, the sequential formation of syntactic intergrowths, 2201, 2212 and 2223 structures, was followed as a function of temperature, time, seeding and gaseous atmosphere. At 895℃, slight melting assists the formation of 〜95% pure 2223; the presence of carbonate is probably deleterious.
- 社団法人応用物理学会の論文
- 1990-02-20
著者
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Ratto Joseph
Rockwell International Science Center
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Porter John
Rockwell International Science Center
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HOUSLEY Robert
Rockwell International Science Center
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MORGAN E.
Rockwell International Science Center
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Housley Robert
Rockwell International Science Center:california Institute Of Technology.