TSEE Response of Sputtered MgO Films to Low-Energy X-Ray Doses

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概要

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• MgO films doped with various elements have been prepared by means of Ar rf-sputtering and the response of thermally stimulated exoelectron emission (TSEE) to a soft X-ray dose has been measured using a GM counter of the gas flow type. The films doped with 0.1% of KCl or Al_2O_3 seem to be promising for dosimetry use, showing a sensitivity to X-rays below 2 keV at an exposure level of 0.3 R. To estimate the level, the X-ray energy dependence of the TSEE response is studied and compared with that of typical TL dosimeters.

• 社団法人応用物理学会の論文
• 1990-08-20

著者

• HUZIMURA Ryoitiro

  Nara University of Education

• Huzimura R

  Nara Univ. Education Nara Jpn

• OGITA Katsunori

  Nara University of Education

関連論文

• Kinetics of Exoelectron After-Emission from MgO : Exoemission Mechanism and Related Phenomena
• TSEE Responses of Oxides Energetic Ion Bombardment
• Formation of Color Centers in KCl(Tl) after Linac Electron Pulse at Room Temperature
• TSEE Response of Sputtered MgO Films to Low-Energy X-Ray Doses

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