Measurement Accuracy of Complex Permittivity in the Dielectric Rod Resonator Method
スポンサーリンク
概要
- 論文の詳細を見る
The measurement accuracy of complex permittivity in the dielectric rod resonator method has been investigated. The measurement error of relative permittivity is 0.05% (standard deviation), which is permissible for the applications of resonators. The dielectric loss was measured by setting conducting plates at both ends of the dielectric resonator. The frequency dependence of the conductivity due to the surface roughness of the plates was investigated using three kinds of standard rod resonators. It is concluded that the measurement error of tan δ can be reduced to 1.5 × 10^<-6> (standard deviation) for a dielectric specimen with ε_r=30.2 at 10 GHz by using the high-〓standard dielectric rod resonators which are placed between conducting plates with surface roughness less than the skin depth at the measurement frequency.
- 社団法人応用物理学会の論文
- 1992-09-30
著者
-
Wakino Kikuo
Yokaichi Plant Murata Manufacturing Co. Lid.
-
TAKAGI Hitoshi
Yokaichi Plant, Murata Manufacturing Co., Lid.
-
FUJINAMI Naokatsu
Yokaichi Plant, Murata Manufacturing Co., Lid.
-
TAMURA Hiroshi
Yokaichi Plant, Murata Manufacturing Co., Lid.
-
Fujinami Naokatsu
Yokaichi Plant Murata Manufacturing Co. Lid.
-
Takagi Hitoshi
Yokaichi Plant Murata Manufacturing Co. Lid.
-
Tamura Hiroshi
Yokaichi Plant Murata Manufacturing Co. Lid.