High-Precision Measurement for Refractive Index Distribution and Dispersion Using an Improved Scanning Total Reflection Method
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1992-05-30
著者
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Hashimoto T
Shimadzu Corp. Kanagawa Jpn
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Matsuzaki H
Nhk Science And Technical Research Laboratories
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HASHIMOTO Takeshi
T. Morokuma Research Laboratory, Olympus Optical Co., Ltd.
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MATSUZAKI Hiroshi
T. Morokuma Research Laboratory, Olympus Optical Co., Ltd.
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TSUCHIDA Hirofumi
T. Morokuma Research Laboratory, Olympus Optical Co., Ltd.
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YAMAMOTO Kimiaki
T. Morokuma Research Laboratory, Olympus Optical Co., Ltd.
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Tsuchida H
Olympus Optical Co. Ltd. Corporate Research Division
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Yamamoto Kimiaki
T. Morokuma Research Laboratory Olympus Optical Co. Ltd.
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Matsuzaki Hiroshi
T. Morokuma Research Laboratory Olympus Optical Co. Ltd.
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Hashimoto Takeshi
T. Morokuma Research Laboratory Olympus Optical Co. Ltd.
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