Write/Erase Cyclability of TbFeCo for Mark-Edge Recording
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概要
- 論文の詳細を見る
Write/erase cyclability for mark-edge recording is studied using rare-earth element[RE]-rich TbFeCo media. Mark-edge jitter for the (1-7) random pattern is small enough even after millions of cycles of data writing and erasing.
- 社団法人応用物理学会の論文
- 1993-11-30
著者
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Ohta N
Engineering Research Laboratory Hitachi Maxell Ltd.
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Ohta N
Optoelectronics Laboratory Hitachi Maxell Ltd.
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Ohta Norio
Opto-electronics Laboratory Hitachi Maxell Ltd.
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Awano Hiroyuki
Central Research Laboratory Hitachi Ltd.
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OJIMA Masahiro
Central Research Laboratory, Hitachi Ltd.
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Ojima Masahiro
Central Research Laboratory Hitachi Ltd.
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Toda Tsuyoshi
Central Research Laboratory Hitachi Ltd.
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Shimazaki K
Hitachi Maxell Ltd. Ibaraki Jpn
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YOSHIHIRO Masafumi
Opto-electronics Laboratory, Hitachi Maxell Ltd.
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SHIMAZAKI Katsusuke
Opto-electronics Laboratory, Hitachi Maxell Ltd.
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Yoshihiro Masafumi
Development & Technology Division Hitachi Maxell Ltd.
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