Atomic Force Microscope Usirug an Optical Fiber Heterodyne Interferometer Free from External Disturbances

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1993-06-30

著者

• Sakai Y

  Ashiya Univ. Hyogo Jpn

• OSHIO Takanori

  Ashiya University

• NAKATANI Noboru

  Ashiya University

• SAKAI Yoshiyuki

  Ashiya University

• SUZUKI Norihito

  Osaka Electro-Communication University

• Sakai Yosuke

  Dept. Electrical Engineering Faculty Of Engineering Hokkaido University

• Nakatani N

  Faculty Of Engineering Toyama University

関連論文

• Surface Structure and Electronic States of V_2O_5 Surface Studied by Scanning Tunneling Microscopy/Spectroscopy
• Atomic Force Microscope Usirug an Optical Fiber Heterodyne Interferometer Free from External Disturbances
• The Effective Ionization Coefficient in SF_6/Xe-Mixtures
• The Effect of Interposing Thin Oxide Layers on the Photovoltaic Properties of a-Si:H Solar Cells. : I. Between a-Si:H and Transparent Conductive Oxide Layers : Condensed Matter
• Measurements of the Flow Velocity and Temperature of Gases by the Laser Photothermal Effect with a Differential Interferometer

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