Moire Patterns Appearing in the Electron Microscopic Images of Grain Boundaries

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概要

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• Intensity distribution of moire patterns appearing in the electron microscopic images of interfaces such as twin, precipitation-matrix and small angle tilt boundaries has been discussed by the dynamical theory of electron diffraction considering absorption of electron waves. The theoretical conclusions, which show that the contrast of the patterns varies by the variation of the thickness of the crystal and the deviation from the Bragg angle, have been compared with electron microscopic observations. Some intensity anomalies appearing in the images of precipitation-matrix boundary have also been explained.

• 社団法人応用物理学会の論文
• 1969-12-05

著者

• HASHIMOTO Hatsujiro

  Kyoto Technical University

• Kodera Minoru

  Kyoto Technical University

関連論文

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• High Temperature Gas Reaction Specimen Chamber for an Electron Microscope
• Moire Patterns Appearing in the Electron Microscopic Images of Grain Boundaries
• Study of Thin Crystalline Films by Universal Electron Diffraction Microscope

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