Electron Microscopy of Thin Twins and Stacking Faults
スポンサーリンク
概要
- 論文の詳細を見る
It is shown that complex patterns appearing in the electron microscopic images of thin twins are related to overlapping of two boundaries, bending of foils, and existence of lattice defects such as dislocations and successive stacking faults. Overlapping of distant stacking faults sometimes shows contrasts similar to those of thin twins. It is found to be possible to distinguish between them by using properties of those patterns.
- 社団法人応用物理学会の論文
- 1966-09-15
著者
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FUJITA Hiroshi
National Research Institute for Metals
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KAWASAKI Yozo
National Research Institute for Metals
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