Very-Small Angle X-Ray Scattering from Amorphous Silica before and after Thermal Neutron Irradiation

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概要

• 論文の詳細を見る

• The very-small angle region of X-ray scattering, down to 0.1 sec. of arc, of irradiated and unirradiated amorphous SiO_2, was explored with a Bonse-Hart type small angle diffractometer. Before the irradiation no central peak of finite width was observed. Thermal neutron irradiation, of intensity 3×10^<19> neutrons/cm^2 at 48℃, gave rise to a central peak of width 0.7 sec of arc. This observation suggests that the structure of amorphous SiO_2 becomes inhomogenized by the irradiation, the range of the inhomogeneity being estimated at 5×10^4 Å by Guinier's approximation.

• 社団法人応用物理学会の論文
• 1980-04-05

著者

• Kohra K.

  National Laboratory For High Energy Physics

• SUZUKI C.K.

  Faculty of Engineering, University of Tokyo

• DOI K.

  Japan Atomic Energy Research Institute

• Suzuki C.k.

  Faculty Of Engineering University Of Tokyo

関連論文

• Very-Small Angle X-Ray Scattering from Amorphous Silica before and after Thermal Neutron Irradiation
• The Structure Analysis of AuCu_3 by Means of a Fourier Transformation of X-ray Diffuse Scatterings

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