Temperature Distribution, Temperature Gradient and Current Crowding : The Macroscopic Driving Force for Electromigration

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概要

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• An analytical solution of time-dependent temperature distribution for a conducting thin film stripe with a rectangular crack has been obtained exactly using Laplace and Fourier Mellininversion transformation. Most of the calculations agree with the previous results except in oneimportant aspect, namely, the values of temperature gradient at the edge of the crack is substantially lower than that at the terminals of a stripe. In fact, the macroscopic driving force formass flux divergence at the crack is predominantly of the current crowding origin. The latter is as least several orders of magnitude greater than the temperature gradient effect.

• 社団法人応用物理学会の論文
• 1977-05-05

著者

• Huang Huei-li

  Department Of Physics National Taiwan University

• Lin Chin-chia

  Department Of Physics National Taiwan University

関連論文

• Temperature Distribution in a Cracked Stripe
• Temperature Distribution, Temperature Gradient and Current Crowding : The Macroscopic Driving Force for Electromigration

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