Properties and Applications of Derivative Signal in SEM
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概要
- 論文の詳細を見る
The main properties of the derivative signal in a scanning electron microscope are disscussed. Techniques for measuring the resolution and the rate of contamination using it are presented. Finally, other useful applications of derivative signal are pointed out.
- 社団法人応用物理学会の論文
- 1975-07-05
著者
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Cabrera Enrique
Institute Of Physics Unam P.o.
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YACAMAN M.
Institute of Physics, UNAM, P.O.
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Yacaman M.
Institute Of Physics Unam P.o.
関連論文
- Properties and Applications of Derivative Signal in SEM
- Study of High Resolution TEM Images of Nanoparticles either Supported on Amorphous Films or Embedded in a Crystalline Matrix