Effect of Injected Current on Current-Mode Second Breakdown in Silicon PNN^+ Structure
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1975-12-05
著者
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Hane Kunio
Department Of Electrical Engineering Faculty Of Engineering Keio University
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SUZUKI Tokio
Department of Electrical Engineering, Faculty of Engineering, Keio University
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Suzuki Tokio
Department Of Electrical Engineering Faculty Of Engineering Keio University
関連論文
- Effect of Injected Current on Current-Mode Second Breakdown in Silicon PNN^+ Structure
- Effect of External Resistance in the Vicinity of Current-Mode Second Breakdown in Si PNN^+ Structures