An Experimental Study of Cu-Rich Layer in ZnS: Mn, Cu, Cl and ZnS: Cu, Cl Electroluminescent Films by Electron Diffraction

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概要

• 論文の詳細を見る

• It is confirmed by electron diffraction that excess copper or copper compounds in ZnS evaporant evaporate last, and they form mainly α-Cu_2S layer near the surface of the EL films prepared by vacuum evaporation. Any solid solution phase is not detected in the junction layer of the two materials; ZnS and copper sulfide. These results are compared with the previous results obtained by the electrical measurements on the EL films of ZnS: Mn, Cu, Cl.

• 社団法人応用物理学会の論文
• 1973-05-05

著者

• Uchida Wakio

  College Of General Education Tohoku University

• Uchida Wakio

  College Of Arts And Sciences Tohoku University

関連論文

• Distribution Patterns of Strain and Dislocations Around Indented Areas in Germanium Crystals as Observed by X-Ray Topography
• Electroluminescence from Cu_2S-ZnS: Mn, Cu, Cl Heterojunctions
• An Experimental Study of Cu-Rich Layer in ZnS: Mn, Cu, Cl and ZnS: Cu, Cl Electroluminescent Films by Electron Diffraction

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