A Vickers Type Ultra-Microhardness Tester for Thin Films
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1972-05-05
著者
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KINOSITA Koreo
Department of Physics, Gakushuin University
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Kinosita Koreo
Department Of Physics Gakushuin University
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Kinosita Koreo
Department Of Applied Physics Faculty Of Engineering University Of Nagoya
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Nishibori Mineo
Department Of Physics Gakushuin University
関連論文
- Stress in Vacuum Deposited Films of Silver
- Thickness-Dependence of Stress in Vacuum Deposited Silver Films
- Stress in Very Thin Vacuum-Evaporated Films of Silver
- On the Physical Cleaning of Surfaces : I. Spectra of Gliding Sparks on Contaminated Glass Surfaces
- A Note on the Theories Underlying the Polarimetric Study of Very Thin Dielectric Surface Layers
- Refractive Index and Pore Structure of Acid-Leached Surface Layer of Glass
- Spiral Cleavage of Mica
- Half-Shade Device for the Precise Measurement of the Principal Angle of Incidence
- Ellipsometric Study of Polished Glass Surfaces
- An Improved Method of Calculation for the Ellipsometric Determination of n and d of a Transparent Surface Film : Polarized Light
- Adsorption of Water Vapour on a Cleavage Surface of Lithium Fluoride
- A Vickers Type Ultra-Microhardness Tester for Thin Films
- Studies in Glass-Cleaning Procedures by Static Friction Measurement
- Numerical Evaluation of the Intensity Curve of a Multiple-Beam Fizeau Fringe