Investigations of Images of a Superdislocation and a Dislocation Dipole Using the Systematic Reflections

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概要

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• A study is made on the resolution of images of pairs of closely spaced dislocations in the bright-field electron microscopy when the foil is tilted to give the systematic reflections. Experiments are carried out on a superdislocation in an ordered Cu_3Au alloy and on a dislocation dipole in stainless-steel, using electron microscopes operated at 125 kV and 500 kV. The image width of dislocation becomes narrow and the resolution is improved by tilting a specimen to give the systematic reflections and to satisfy the Bragg condition at higher-order reflections. A superdislocation with a separation of 50Å between a pair of dislocations is observed as a two-line image. It is shown that this technique gives as good a resolution of closely spaced dislocations as the weak-beam technique.

• 社団法人応用物理学会の論文
• 1972-10-05

著者

• FUKAMACHI Masatoshi

  University of California, Department of Materials Science and Engineering

関連論文

• Investigations of Images of a Superdislocation and a Dislocation Dipole Using the Systematic Reflections

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