Near-Field Magnetic Measurements and Their Application to EMC of Digital Equipment(<Special Section>Near-/Far-Field EM Absorption and Shielding)

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概要

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• Techniques of near-field magnetic measurement and their applications to EMC of digital equipment are described. Magnetic-field measurement near PCB or LSI is the mostly used technique to specify the source. This paper treats an example of board analysis by near-field magnetic measurement, the sensing mechanism and the structure of a loop probe, and a recent progress of this method and application. To establish appropriate design direction in high-speed and high-density packaging of electronic equipment, electromagnetic behavior in chip and package should be clarified. Expectation of development for measuring minute area is more and more increasing.

• 社団法人電子情報通信学会の論文
• 2006-01-01

著者

• Masuda Norio

  Jisso And Production Technologies Research Laboratories Nec Corporation

• HARADA Takashi

  Jisso and Production Technologies Research Laboratories, NEC Corporation

• YAMAGUCHI Masahiro

  Tohoku University

• Harada Takashi

  Jisso And Production Technologies Research Laboratories Nec Corporation

関連論文

• Third International Workshop on High Frequency Micromagnetic Devices and Materials (MMDM3)
• Near-Field Magnetic Measurements and Their Application to EMC of Digital Equipment(Near-/Far-Field EM Absorption and Shielding)
• Fourth International Workshop on High Frequency Micromagnetic Devices and Materials(MMDM4)(Selected Papers from the Fourth International Workshop on High Frequency Micromagnetic Devices and Materials(MMDM4))

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