X線光子束に対するテルル化カドミウム半導体検出器のレスポンス特性

概要

論文の詳細を見る
The Cadmium-Telluride (CdTe) semiconductor, which can be used at normal temperatures without cooling, was recently developed for the measurement of X-ray spectra. In this paper, we calculated the energy-dependent responses of CdTe semi-conductor detectors to X-ray photon beams by means of the Monte Carlo simulation. The CdTe semiconductor showed higher K-escape fractions and lower photo-peak efficiencies than the high purity Germanium (HPGe) semiconductor that has generally been used for X-ray spectra measurements. Therefore, it is assumed that the output spectra measured by the CdTe detector are more distorted than those measured by the HPGe detector. The X-ray spectra measured by CdTe semiconductor detectors must be corrected to account for the energy dependent response of CdTe.
公益社団法人日本放射線技術学会の論文
1996-12-20