A Fundamental Study on Measurement for Dielectric Constant on Materials by Ellipsometry Method in Millimeter-Wave Band (IEICE Trans., Vol. J86-B, No.5 in Japanese)

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概要

• 論文の詳細を見る
• 社団法人電子情報通信学会の論文
• 2003-05-01

著者

• Sakai Taiji

  Dept. Of Electrical Engineering And Electronics Aoyama Gakuin University

• Hashimoto Osamu

  Dept. Of Electrical Engineering And Electronics Aoyama Gakuin University

• TSUZUKIYAMA Kouji

  Mitsui Chemicals, INC.

• YAMAZAKI Takaaki

  Dept. of Electrical Engineering and Electronics, Aoyama Gakuin University

• Tsuzukiyama Kouji

  Mitsui Chemicals Inc.

• Yamazaki Takaaki

  Dept. Of Electrical Engineering And Electronics Aoyama Gakuin University

関連論文

• A Study on Practical Use of a Thin Thickness Radiowave Absorber Using an FSS in X Band(The IEICE Transactions (publishedin Japanese) Vol. J 86-B, No.6(Communications))
• A Study on Ralization of Wide Band Characteristics for a 40 GHz Band Wave Absorber Using M-Type Hexagonal Ferrite
• A Fundamental Study on Measurement for Dielectric Constant on Materials by Ellipsometry Method in Millimeter-Wave Band (IEICE Trans., Vol. J86-B, No.5 in Japanese)

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