Reliability and Lifetime Estimation for Large-Scale Photonic Cross-Connect Switches of Photonic Networks (<Joint Special Issue> Recent Progress in Optoelectronics and Communications)
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概要
- 論文の詳細を見る
Three-dimensional MEMS optical switches (3D-MEMS) and planar lightwave circuit thermo-optical switches (PLC-TOSW) are suitable for use in large-scale photonic cross-connect switches (PXCs). Usually, such large-scale optical switches are created by integrating many small switch elements (such as 1×2 switches). Therefore, the reliability or lifetime of the individual switch element greatly affects the reliability of the PXC system. In this paper, the effect of the number and failure probability of switch elements on PXC reliability is statistically estimated. First, the equivalent number of switch elements needed to compose a large-scale PXC is determined for the switch types mentioned above. Based on this evaluation, yields and lifetimes of switch modules are estimated for each switch type. The improvement in reliability due to switch duplication (preparing spare switches) is also estimated and discussed.
- 社団法人電子情報通信学会の論文
- 2003-05-01
著者
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Koga Masafumi
Ntt Network Innovation Laboratories Ntt Corporation
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NOGUCHI Kazuhiro
NTT Network Innovation Laboratories, NTT Corporation
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Noguchi Kazuhiro
Ntt Network Innovation Laboratories Ntt Corporation
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- Reliability and Lifetime Estimation for Large-Scale Photonic Cross-Connect Switches of Photonic Networks(The IEICE Transactions on Communications, Vol.E86-B, No.5)
- Next Generation Optical Communication Technologies for Realizing Bandwidth Abundant Networking Capability
- Reliability and Lifetime Estimation for Large-Scale Photonic Cross-Connect Switches of Photonic Networks ( Recent Progress in Optoelectronics and Communications)