A Unified Model for the Simulation of Small-Geometry Devices (Special Issue on 1993 VLSI Process and Device Modeling Workshop (VPAD93))
スポンサーリンク
概要
- 論文の詳細を見る
In this paper, the formulation of unified transport model is reviewed along with its implementation in a three-dimensional device simulator. The model features an accurate description of the energy exchange among electrons, holes and lattice, and is therefore suitable for self-consistently simulating thermal effects and non-stationary phenomena, as well as their possible interactions. Despite the model complexity, it is shown that the computational effort required for its solution is reasonably close to more conventional approaches. Application examples are also given, in which both unipolar and bipolar devices are simulated, discussing the relative importance of different phenomena and highlighting the simultaneous occurrence of carrier and lattice heating.
- 社団法人電子情報通信学会の論文
- 1994-02-25
著者
-
Ciampolini P
Univ. Parma Ita
-
Baccarani Giorgio
The Dipartimento Di Elettronica Informatica E Sistemistica Universita Di Bologna
-
Ciampolini Paolo
the Istituto di Elettronica, Universita di Perugia
-
Pierantoni Anna
the Dipartimento di Elettronica Informatica e Sistemistica, Universita di Bologna
-
Liuzzo Andrea
the Dipartimento di Elettronica, Informatica e Sistemistica, Universita di Bologna
-
Liuzzo Andrea
The Dipartimento Di Elettronica Informatica E Sistemistica Universita Di Bologna
-
Pierantoni Anna
The Dipartimento Di Elettronica Informatica E Sistemistica Universita Di Bologna
関連論文
- Three-Dimensional Evaluation of Substrate Current in Recessed-Oxide MOSFETs
- Comparison between a posteriori Error Indicators for Adaptive Mesh Generation in Semiconductor Device Simulation (Special Issue on 1993 VLSI Process and Device Modeling Workshop (VPAD93))
- A Unified Model for the Simulation of Small-Geometry Devices (Special Issue on 1993 VLSI Process and Device Modeling Workshop (VPAD93))