Analysis of Nonohmic Piezoelectric Resonator Contacts (Special Issue on Recent Electromechanical Devices)
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概要
- 論文の詳細を見る
Single-crystal LiNbO_3 and LiTaO_3 piezoelectric resonators were developed for surface-mount technology (SMT) used in electronic equipment manufacturing. Using an energy-trapping design, a shear-mode piezoelectric resonator chip is bonded directly to the board with conductive resin and covered with a ceramic cap. The process occasionally produces nonlinear resonators, however, which led us to study the frequency characteristics of impedances for the abnormal samples. Their input impedances at the resonant frequency depended on the driving voltage. The insulator between the thin film metal electrode on the crystal strip or the thick film electrode on the ceramic base, in conjunction with silver balls in the adhesive resin, apparently caused the problem. Assuming that the insulator makes diode contacts, which show stable nonohmic phenonena or cause a discharge in a conductor causing a drastically changing in the impedance, we proposed the following corrective action: subject the nonohmic contacts to a high-voltage frequency-swept signal near the resonant frequency. The samples subjected to the high voltages recovered metalic contact and maintained even after severe thermal cycle testing.
- 社団法人電子情報通信学会の論文
- 1994-10-25
著者
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Ono Masaaki
The Electronic Device Group Fujitsu Limited
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Wakatsuki Noboru
the Electronic Device Group, FUJITSU LIMITED
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Fukayama Kenji
the Electronic Device Group, FUJITSU LIMITED
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Yachi Masanori
the Electronic Device Group, FUJITSU LIMITED
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Fukayama Kenji
The Electronic Device Group Fujitsu Limited
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Yachi M
Fujitsu Media Devices Ltd. Nagano Jpn
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Wakatsuki Noboru
The Electronic Device Group Fujitsu Limited