Characterization of Microstrip Lines Near Edge of Dielectric Substrate with Rectangular Boundary Division Method (Special Issue on Microwave and Millimeter-Wave Technology for Advanced Functioions and Size-Reductions)
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概要
- 論文の詳細を見る
In this paper, the characteristics of microstrip lines near the edge of dielectric substrate are analyzed by improving the rectangular boundary division method. The numerical results indicate the changes of the characteristics of a microstrip line when the strip conductor is closely located to the edge. When the distance the dielectric substrate edge to the strip conductor is less than the thickness of dielectric substrate, the effects of the edge on the line characteristics are no longer negligible. The numerical results in this paper show high computation accuracy without increasing computation time. Our improvement is effective for the analysis of the microstrip lines both for the narrow strip conductor and the strip conductor close to the edge. The relative errors between the numerical results and the measured values are less than 1.2%.
- 社団法人電子情報通信学会の論文
- 1993-06-25
著者
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Li K
Department Of Electronic Engineering The University Of Electro-communications
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Li Keren
Faculty of Electro-Communications, University of Electro-Communications
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Atsuki Kazuhiko
Faculty of Electro-Communications, University of Electro-Communications
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Yajima Hitoshi
Faculty of Electro-Communications, University of Electro-Communications
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Yamashita Eikichi
Faculty of Electro-Communications, University of Electro-Communications
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Li K
Wireless Communications Division Communications Research Laboratory (crl)
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Atsuki K
Department Of Electronic Engineering The University Of Electro-communications
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Yajima Hitoshi
Faculty Of Electro-communications University Of Electro-communications
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Li K
Department Of Mechanical Engineering And Intelligent System University Of Electro-communications
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Yamashita E
Univ. Electro‐communications Chofu‐shi Jpn
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Yamashita Eikichi
Faculty Of Electro-communications University Of Electro-communications
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- Characterization of Microstrip Lines Near Edge of Dielectric Substrate with Rectangular Boundary Division Method (Special Issue on Microwave and Millimeter-Wave Technology for Advanced Functioions and Size-Reductions)
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