A New Diagnostic Method Using Probabilistic Temporal Fault Models(<特集>Special Issue on the 2000 IEICE Excellent Paper Award)

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概要

• 論文の詳細を見る

• This paper introduces a probabilistic modeling of alarm observation delay, and shows a novel method of modelbased diagnosis for time series observation. First, a fault model is defined by associating an event tree rooted by each fault hypothesis with probabilistic variables representing temporal delay. The most probable hypothesis is obtained by selecting one whose Akaike information criterion (AIC) is minimal. It is proved by simulation that the AIC-based hypothesis selection achieves a high precision in diagnosis.

• 社団法人電子情報通信学会の論文
• 2002-03-01

著者

• SHIRATORI Norio

  RIEC, Tohoku University

• MATSUMOTO KAZUNORI

  KDDI R&D Laboratories

• HASHIMOTO Kazuo

  KDDI Labs USA, Inc.

• Shiratori Norio

  Riec Tohoku Univ.

• Hashimoto Kazuo

  Kddi Labs. Usa Inc.

• Matsumoto Kazunori

  Kddi R&d Laboratories Inc.

• Matsumoto Kazunori

  Kddi R&d Inc.

• SHIRATORI Norio

  RIEC, Tohoku Univ.

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