Cellular Automata Implementation of TPG Circuits for Built-In Two-Pattern Testing(Special Issue on Test and Diagnosis of VLSI)

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概要

• 論文の詳細を見る

• Cellular automata(CA)implementations are expected as potential test-pattern generators(TPGs)for Built-In Self-Testing of VLSI circuits, in which highly random parallel patterns ought to be generated with simple hardware. Objective here is to design one-dimensional, binary, and linear CA implementations with cyclic boundary conditions that can operate on maximum length of period. To provide maximum period of operations, it is necessary to bring some irregularities into the configurations. It is also expected for TPGs to make maximum or sufficiently long period of operations to prevent re-initialization. Our approach is to generate transition matrices based on fast parallel implementations of LFSRs which have trinomials as characteristic polynomials and then to modify the diagonal components. Some notable properties of diagonal vectors were observed.

• 社団法人電子情報通信学会の論文
• 1998-07-25

著者

• Nakamura Naoki

  The Graduate Cource Of Electrical Engineering And Electronics Chuo University

• Furuya Kiyoshi

  The Department Of Information And System Engineering Chuo University

• Furuya Kiyoshi

  The Department Of Information And System Engineering Faculty Of Science And Engineering Chuo Univers

関連論文

• State Diagrams of Elementary Cellular Automata with Arbitrary Boundary Conditions(Special Issue on Test and Diagnosis of VLSI)
• Cellular Automata Implementation of TPG Circuits for Built-In Two-Pattern Testing(Special Issue on Test and Diagnosis of VLSI)

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