Robustness of the Memory-Based Reasoning Implemented by Wafer Scale Integration

概要

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The Memory-Based Reasoning (MBR) is one of the mainstay approaches in massively parallel artificial intelligence research. However, it has not been explored from the viewpoint of hardware implementation. This paper demonstrates high robustness of the MBR, which is suitable for hardware implementation using Wafer Scale Integration (WSI) technology, and proposes a design of WSI-MBR hardware. The robustness is evaluated by a newly developed WSI-MBR simulator in the English pronunciation reasoning task, generally known as MBR Talk. The results show that defects or other fluctuations of device parameters have only minor impacts on the performances of the WSI-MBR. Moreover, it is found that in order to get higher reasoning accuracy, the size of the MBR database is much more crucial than the computation resolution. These features are proved to be caused by the fact that MBR does not rely upon each single data unit but upon a bulk data set. Robustness in the other MBR tasks can be evaluated in the same manner as discussed in this paper. The proposed WSI-MBR processor takes advantage of benefits discovered in the simulation results. The most area-demanding circuits-that is, multipliers and adders-are designed by analog circuits. It is expected that the 1.7 million processors will be integrated onto the 8-inch silicon wafer by the 0.3 μm SRAM technology.
社団法人電子情報通信学会の論文
1993-03-25