Comparing Failure Times via Diffusion Models and Likelihood Ratio Ordering (Special Section on Information Theory and Its Applications)

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概要

• 論文の詳細を見る

• For two devices whose quality is described by non-negative one-dimensional time-homogeneous diffusion processes of the Wiener and Ornstein-Uhlenbeck types sufficient conditions are given such that their failure times, modeled as first-passage times through the zero state, are ordered according to the likelihood ratio ordering

• 社団法人電子情報通信学会の論文
• 1996-09-25

著者

• Ricciardi L

  Univ. Napoli Napoli Ita

• Crescenzo Antonio

  The Dipartimento Di Matematica E Applicazioni-universita Di Napoli "federico Ii

• RICCIARDI Luigi

  the Dipartimento di Matematica e Applicazioni-Universita di Napoli "Federico II"

関連論文

• Comparing Failure Times via Diffusion Models and Likelihood Ratio Ordering (Special Section on Information Theory and Its Applications)

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