Stuck-Open Fault Detection in CMOS Circuits Using Single Test Patterns

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概要

• 論文の詳細を見る

• Transistor stuck-open faults in CMOS devices are such that they force combinational circuits to exhibit sequential behaviors. It has been proved that, in general, stuck-open faults can not be modeled as stuck-at faults and, therefore, a sequence of two consecutive test vectors is necessary to guarantee stuck-open fault detection. In this paper we propose a technique to modify CMOS circuits in such a way that any stuck-open fault in the circuit can be detected using only a single test pattern. The amount of additional logic required to achieve the goal is rather

• 社団法人電子情報通信学会の論文
• 1994-11-25

著者

• Xu Qing

  Dept. Of Electrical Engineering University Of Toronto

• Macii Enrico

  Dip. di Automatica e Informatica, Politecnico di Torino

• Macii Enrico

  Dip. Di Automatica E Informatica Politecnico Di Torino

関連論文

• Stuck-Open Fault Detection in CMOS Circuits Using Single Test Patterns

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