Investigation of ESD Prevention for Deshunted GMR Heads(Storage Technology)

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概要

• 論文の詳細を見る

• The electrostatic discharge (ESD) effect in GMR heads in the deshunting process is studied in order to prevent the damage in this process. The simulation and experiment results are investigated and compared. It is found from these results that sequences of deshunting process, currently operating, can cause the damage of GMR heads due to the ESD effect, based on the charged device model, CDM. This also shows that the voltage across GMR head, as the tweezers is used, can be raised up to 〜3.7 V which is about harmful to damage the head. Examples of damage heads confirmed by the SEM are also shown.

• 社団法人電子情報通信学会の論文
• 2005-06-01

著者

• MATSUMOTO Mitsunori

  Shinshu University

• Siritaratiwat Apirat

  Khon Kaen Univ. Khon Kaen Tha

• SURAKAMPOLTORN Wanlop

  KMIT

関連論文

• Quantitative analysis of magnetic vortex in nano elliptical elements by scanning transmission electron microscopy
• Investigation of ESD Prevention for Deshunted GMR Heads(Storage Technology)

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