Non Destructive Evaluation in Multilayer Structure Using the High T_c SQUID(SQUIDs, <Special Section>Superconducting Electronic Devices and Their Applications)

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概要

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• The High T_c SQUID was used in an unshielded environment to make eddy current nondestructive testing measurement on a multilayer aluminum structure. As a demonstration of their capabilities, subsurface defects in a multilayer aluminum structure have been located and mapped using phase shift with no magnetic shielding around the specimen.

• 社団法人電子情報通信学会の論文
• 2005-02-01

著者

• Nakane Hideaki

  The Author Is With Muroran Institute Of Technology

関連論文

• Non Destructive Evaluation in Multilayer Structure Using the High T_c SQUID(SQUIDs, Superconducting Electronic Devices and Their Applications)

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