An Accurate and Low-Cost Method for On-Wafer LNA Noise Figure Measurement(Active Devices and Circuits)(<Special Section>Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)

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概要

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• In this paper, an accurate and low-cost method for on-wafer noise figure measurement, specifically designed for low-noise amplifiers (LNAs), will be proposed. An experiment conducted on a 5 GHz LNA demonstrates that a good agreement can be reached between the measurement result of the proposed method and that of a commercial noise parameter measurement system.

• 社団法人電子情報通信学会の論文
• 2004-05-01

著者

• Chen Kim-ming

  Natinal Nano Device Laboratories

• Huang Guo-wei

  Natinal Nano Device Laboratories

• WEN Sheng-Yu

  Natinal Nano Device Laboratories

関連論文

• An Accurate and Low-Cost Method for On-Wafer LNA Noise Figure Measurement(Active Devices and Circuits)(Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)

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