Electric-Field Scanning System Using Electro-Optic Sensor(Measurements Techniques)(Special Issue on Recent Progress in Microwave and Millimeter-wave Photonics Technologies)
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概要
- 論文の詳細を見る
To perform a high-speed measurement of a two-dimensional electric-field distribution, we developed an electric-field scanning system using a large-aperture electro-optic crystal and a laser-beam scanner. In the system, a two-dimensional electric-field image projected onto the crystal is read off using beam scanning through an electro-optic effect. With the imaging system, only 20 to 40 seconds are needed to obtain both millimeter-wave amplitude and phase images of a 20 × 30 mm area with a pixel spacing of 0.5mm. We measured radiation patterns of a 10-GHz dipole antenna and compared them with simulation results to investigate a disturbance of the patterns inside the crystal. Profiles of a 120-GHz millimeter-wave beam were also measured to determine the effects of a dielectric lens used to focus the beam. Furthermore, we applied the system to imaging several objects with 180-GHz millimeter waves and experimentally showed that it is a valid means for a non-destructive inspection of hidden objects.
- 社団法人電子情報通信学会の論文
- 2003-07-01
著者
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Sasaki Ai-ichiro
Ntt Microsystem Integration Laboratories
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NAGATSUMA Tadao
NTT Microsystem Integration Laboratories, NTT Corporation
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Nagatsuma Tadao
Ntt Microsystem Integration Laboratories
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