The Effect of Focus Voltage and Beam Repulsion on the Microscopic Electron Spot Shape(CRT Technology)(<Special Issue>Electronic Displays)

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概要

• 論文の詳細を見る

• The size of the microscopic electron spot is an important parameter for the white-uniformity of a CRT. It changes as a function of the focus voltage and beam repulsion This paper explains the mechanism behind this phenomenon The model is supported by means of measurements.

• 社団法人電子情報通信学会の論文
• 2003-11-01

著者

• Spanjer Tjerk

  Product & Process Development Department Of Lg. Philips Displays

• SLUYTERMAN A.

  Product & Process Development Department of LG. Philips Displays

• Sluyterman A.

  Product & Process Development Department Of Lg. Philips Displays

関連論文

• The Effect of Focus Voltage and Beam Repulsion on the Microscopic Electron Spot Shape
• The Effect of Focus Voltage and Beam Repulsion on the Microscopic Electron Spot Shape(CRT Technology)(Electronic Displays)

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