A New Solution to Power Supply Voltage Drop Problems in Scan Testing(Scan Testing)(<Special Section>Test and Verification of VLSI)

概要

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As semiconductor manufacturing technology advances, power dissipation and noise in scan testing have become critical problems. Our studies on practical LSI manufacturing show that power supply voltage drop causes testing problems during shift operations in scan testing. In this paper, we present a new testing method named MD-SCAN (Multi-Duty SCAN) which solves power supply voltage drop problems, as well as its experimental results applied to practical LSI chips.
社団法人電子情報通信学会の論文
2004-03-01