Polarization Fatigue Modeling of Ferroelectric Capacitors(Special Issue on Recent Progress in Organic Molecular Electronics)

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概要

• 論文の詳細を見る

• We developed a novel model for degradation of remanent polarization resulting from repeated polarization reversal cycling. The characteristics of ferroelectric capacitors have been simulated with the double saturation function model that required only five parameters; E_c Qrmax, Qdmax, K_r and K_d. This novel model combines an equivalent gap capacitor with the double saturation function model. The model predicts hysteresis loops under endurance conditions. The simulated results are well in agreement with the results obtained in the experiment. The model is utilized to quantify the degradation effect of remanent polarization on ferroelectric memory applications.

• 社団法人電子情報通信学会の論文
• 2002-06-01

著者

• Nishimura Kiyoshi

  Ictstudio

関連論文

• Polarization Fatigue Modeling of Ferroelectric Capacitors(Special Issue on Recent Progress in Organic Molecular Electronics)

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